- About
-
Scanning electron microscope
- Imaging of surfaces by an electron beam scanning the specimen with a resolution of max. 1nm
- Conventional SEM observes specimens in vacuum. Samples are fixed and sputter-coated with gold. The coating back-scatters the electrons towards the detector
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Environmental SEM (ESEM) observes specimens in their natural state under low pressure. Electrons are scatterd by the gaseous film on the surface of the specimen
- Brand
- FEI
- Model
- Quanta 200
- Access
- Open for fee
- Location
- København
- External Link
- http://cab.ku.dk/instruments/scanning_electron_microscope/