About
Titan Analytical can be used in two conditions, transmission (TEM) and scanning transmission (STEM) modes. It is equipped with the FEI X-FEG gun and monochromator, which allows experiments at 120 kV or 300 kV acceleration voltage. With the momochromator, the energy spread can be adjusted between about 1 eV and below 0.2 eV. Furthermore, a CEOS CESCOR Cs-corrector of the condenser lens system is installed. The objective lens has the super-twin (S-Twin) pole piece with 5.2 mm pole gap (Cs about 1.2 mm). The point (interpretable) resolutions for TEM and STEM at 300 kV are 0.2 and 0.08 nm, respectively, which allows atomic arrangements in materials to be visualized clearly. For TEM, a Gatan Ultrascan US1000 CCD (2048×2048 px) is installed, for STEM, a high-angle annular dark field detector (HAADF) or BF/DF detector of the GIF system can be used.

For energy dispersive X-ray spectroscopy (EDS) an Oxford windowless X-Max 80TLE detector is installed, which is running Oxford Aztec analysis software. For electron energy loss spectroscopy (EELS) and energy filtered imaging (EF-TEM), the microscope is equipped with a Gatan Tridiem 865 GIF and a Gatan Ultrascan US1000 CCD (2048×2048 px). The microscope can be used for elemental analysis from regions that are as small as 1 nm and is specifically suited for EDS and EELS mapping (Gatan Digiscan). Specially, monochromated EELS, which is reachable to an energy resolution of 0.15 eV, allows the distribution of surface plasmons in nanostructured materials to be imaged at the nanometer scale and makes possible to determine the valence state of elements (e.g., Fe2+/Fe3+ ratios).

This microscope is also dedicated to magnetic and electrostatic potential imaging since it has a biprism located at a selected-area aperture position and a Lorentz lens. This capability not only offers us to characterize magnetic materials and semiconductor devices but also may make possible to visualize different chemical states in low-density materials such as polymers and biological specimens.